Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications

From National Research Council Canada

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  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
Subjectscanning transmission electron microscopy; contamination; electron-beam induced charging; phase plate; graphitized carbon; thin film
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Peer reviewedYes
NPARC number23002391
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Record identifierfabed280-81e3-4aa5-a0c5-04ea72b8d784
Record created2017-10-26
Record modified2020-03-16
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