A Stereo Vision System for On-Machine Dimensional Metrology
A Stereo Vision System for On-Machine Dimensional Metrology
| Author | Search for: |
|---|---|
| Format | Text, Article |
| Conference | SPIE Proceedings, Applications of Artificial Intelligence VII, March 28-30, 1989., Orlando, Florida, USA |
| Publication date | 1989 |
| Language | English |
| NRC number | NRCC 30105 |
| NPARC number | 5765189 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | d686df5a-3b69-4689-a79d-45e4454b63f2 |
| Record created | 2009-03-29 |
| Record modified | 2020-03-17 |
- Date modified: