Interface structure of Ge/Si superlattices determined by X-Ray absorption fine structure

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1557/PROC-220-253
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Name affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText
TypeArticle
Journal titleMRS Proceedings
ISSN1946-4274
Volume220
Abstract
Publication date
PublisherCambridge University Press
LanguageEnglish
Peer reviewedYes
NPARC number23001770
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Record identifierd5991414-c625-4b87-b871-77fff7517bde
Record created2017-03-31
Record modified2017-03-31
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