Interface structure of Ge/Si superlattices determined by X-Ray absorption fine structure

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1557/PROC-220-253
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
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PublisherCambridge University Press
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LanguageEnglish
Peer reviewedYes
NPARC number23001770
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Record identifierd5991414-c625-4b87-b871-77fff7517bde
Record created2017-03-31
Record modified2020-03-17
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