Silicon nanowire based radio-frequency spectrum analyser

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/ECOC.2010.5621130
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Name affiliation
  1. National Research Council of Canada. NRC Industrial Materials Institute
FormatText, Article
Conference2010 36th European Conference and Exhibition on Optical Communication, ECOC 2010, September 19-23, 2010, Torino, Italy
Abstract
Publication date
PublisherIEEE
In
LanguageEnglish
Peer reviewedYes
NPARC number23002572
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Record created2017-11-30
Record modified2020-04-17
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