| DOI | Resolve DOI: https://doi.org/10.1109/ECOC.2010.5621130 |
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| Author | Search for: Corcoran, B.; Search for: Vo, T. D.; Search for: Pelusi, M.; Search for: Monat, C.; Search for: Xu, D-X.1; Search for: Densmore, A.1; Search for: Ma, R.1; Search for: Janz, S.1; Search for: Moss, D. J.; Search for: Eggleton, B. J. |
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| Affiliation | - National Research Council Canada. NRC Industrial Materials Institute
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| Format | Text, Article |
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| Conference | 2010 36th European Conference and Exhibition on Optical Communication, ECOC 2010, September 19-23, 2010, Torino, Italy |
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| Abstract | We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data. |
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| Publication date | 2010-09 |
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| Publisher | IEEE |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23002572 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | ce6f1fe6-c39c-4e7e-bb13-378a95187667 |
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| Record created | 2017-11-30 |
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| Record modified | 2020-04-17 |
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