Temperature measurement in a tem using electron diffraction of amorphous films
Temperature measurement in a tem using electron diffraction of amorphous films
DOI | Resolve DOI: https://doi.org/10.1017/S1431927617005414 |
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Author | Search for: Hayashida, Misa1; Search for: Cui, Kai1; Search for: Malac, Marek1 |
Name affiliation |
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Format | Text, Article |
Journal title | Microscopy and Microanalysis |
ISSN | 1431-9276 1435-8115 |
Volume | 23 |
Issue | S1 |
Pages | 950–951 |
Publication date | 2017-08-04 |
Publisher | Cambridge University Press |
Language | English |
Peer reviewed | Yes |
NPARC number | 23002379 |
Export citation | Export as RIS |
Report a correction | Report a correction | Record identifier | c8eb11b0-c441-4ec1-815d-5f04eef3cacf |
Record created | 2017-10-25 |
Record modified | 2020-03-16 |