Temperature measurement in a tem using electron diffraction of amorphous films

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S1431927617005414
AuthorSearch for: 1; Search for: 1; Search for: 1
Name affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
Journal titleMicroscopy and Microanalysis
ISSN1431-9276
1435-8115
Volume23
IssueS1
Pages950–951
Publication date
PublisherCambridge University Press
LanguageEnglish
Peer reviewedYes
NPARC number23002379
Export citationExport as RIS
Report a correctionReport a correction
Record identifierc8eb11b0-c441-4ec1-815d-5f04eef3cacf
Record created2017-10-25
Record modified2020-03-16
Report a problem on this page
Date modified: