Temperature measurement in a tem using electron diffraction of amorphous films
Temperature measurement in a tem using electron diffraction of amorphous films
| DOI | Resolve DOI: https://doi.org/10.1017/S1431927617005414 |
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| Author | Search for: Hayashida, Misa1; Search for: Cui, Kai1; Search for: Malac, Marek1 |
| Name affiliation |
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| Format | Text |
| Type | Article |
| Journal title | Microscopy and Microanalysis |
| ISSN | 1431-9276 1435-8115 |
| Volume | 23 |
| Issue | S1 |
| Pages | 950–951 |
| Publication date | 2017-08-04 |
| Publisher | Cambridge University Press |
| Language | English |
| Peer reviewed | Yes |
| NPARC number | 23002379 |
| Export citation | Export as RIS |
| Report a correction | Report a correction | Record identifier | c8eb11b0-c441-4ec1-815d-5f04eef3cacf |
| Record created | 2017-10-25 |
| Record modified | 2020-03-16 |