RF passive devices on Si with excellent performance, close to ideal devices designed by electro-magnetic simulation

Alternative title	IEEE Int’l Electron Device Meeting Technical Digest
Author	Search for: Chin, A.; Search for: Chan, K.; Search for: Wang, C.; Search for: Chen, C.; Search for: Liang, V.; Search for: Chen, J.; Search for: Chien, S.; Search for: Sun, S.; Search for: Duh, D.; Search for: Lin, W.; Search for: Zhu, C.; Search for: Li, M.; Search for: McAlister, Sean¹; Search for: Kwong, D-L
Affiliation	National Research Council Canada. NRC Institute for Microstructural Sciences
Format	Text, Article
Conference	IEEE Int’l Electron Device Meeting, 2003
NPARC number	3539221
Export citation	Export as RIS
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Record identifier	bb431d21-f8a3-44c2-9656-11baec684532
Record created	2009-03-01
Record modified	2020-04-16

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