Resolving and tuning carrier capture rates at a single silicon atom gap state

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DOIResolve DOI: https://doi.org/10.1021/acsnano.7b07068
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  1. National Research Council of Canada. Nanotechnology
FormatText, Article
Subjectcarrier-capture rates; dangling bonds; noncontact atomic force microscopy; silicon; time-resolved scanning tunneling microscopy
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PublisherACS
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LanguageEnglish
Peer reviewedYes
NPARC number23002433
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Record identifierb681fbd1-f23a-452f-b3de-d297f86471a9
Record created2017-11-10
Record modified2020-05-30
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