Characterization of fast neutron irradiated GaAs films by photoluminescence spectroscopy

From National Research Council Canada

AuthorSearch for: ; Search for: ; Search for: ; Search for:
FormatText, Article
ConferenceShallow impurities in semiconductors : proceedings of the Fourth International Conference on Shallow Impurities in Semiconductors, July 31-August 2, 1990, London, England
NRC numberNRC-INMS-1146
NPARC number5765711
Export citationExport as RIS
Report a correctionReport a correction (opens in a new tab)
Record identifier95315903-da34-4ff0-855b-35e76d7843c1
Record created2009-03-29
Record modified2020-04-16
Date modified: