Comparison of ion implantation aroaches in the fabrication of AlGaN/GaN HFETs: classical vs through the gate metal
Comparison of ion implantation aroaches in the fabrication of AlGaN/GaN HFETs: classical vs through the gate metal
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| Format | Text, Article |
| Conference | IPAP Conference Series 1, 2000, Tokyo |
| Publication date | ca 2000 |
| NPARC number | 5212406 |
| Export citation | Export as RIS |
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| Record identifier | 8c5fb574-c501-447c-8880-fa21421e2fd8 |
| Record created | 2008-12-02 |
| Record modified | 2024-12-19 |
- Date modified: