| Download | - View final version: The linewidth broadening factor: a length-scale-dependent analytical approach (PDF, 702 KiB)
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| DOI | Resolve DOI: https://doi.org/10.11648/j.nano.20170501.11 |
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| Author | Search for: Benhsaien, Abdessamad; Search for: Lu, Zhenguo1; Search for: Hinzer, Karin; Search for: Hall, Trevor James |
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| Affiliation | - National Research Council of Canada. Advanced Electronics and Photonics
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| Format | Text, Article |
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| Subject | α–factor; linewidth; enhancement; scattering; spontaneous emission; exciton; mesoscopic; quantum dot |
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| Abstract | A first-order frequency-dependent formula of the linewidth broadening factor (α–factor) is derived in terms of scattering rates whilst, a mesoscopic disk approach is used in order to accompany the dimension effect to the spontaneous emission lifetime (inverse of scattering rate). An excitonic correction to the relaxation properties is shown to occur provided the binding energy of the electron and hole is comparable to their eigenenergy-separation. The ensuing analysis is independent of the selected III-V material system and resides upon three simplifying assumptions which allow for analytical formulae to be derived. |
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| Publication date | 2017-04-17 |
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| Publisher | Science Publishing Group |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23002467 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 80ed0a00-3c4e-4b50-ba64-abbeff96a538 |
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| Record created | 2017-11-14 |
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| Record modified | 2020-05-30 |
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