Hole free phase plate tomography for materials sciences samples

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/j.micron.2018.09.005
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Name affiliation
  1. National Research Council Canada. Nanotechnology
FormatText
TypeArticle
Journal titleMicron
ISSN0968-4328
SubjectHole Free Phase Plate (HFPP); electron tomography; transistor Imaging; molecular electronic junction; interface roughness; Transmission electron microscope (TEM)
Abstract
Publication date
PublisherElsevier
LanguageEnglish
Peer reviewedYes
NPARC number23004075
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Record identifier470fa7e1-607b-48ee-bc92-a7ddd422ffc6
Record created2018-09-25
Record modified2018-09-25
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