| DOI | Resolve DOI: https://doi.org/10.1016/j.micron.2018.09.005 |
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| Author | Search for: Hayashida, Misa1; Search for: Cui, Kai1; Search for: Najarian, Amin Morteza; Search for: Mccreery, Richard1; Search for: Jehanathan, Neerushana; Search for: Pawlowicz, Chris; Search for: Motoki, Sohei; Search for: Kawasaki, Masahiro1; Search for: Konyuba, Yuji; Search for: Malac, Marek1 |
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| Affiliation | - National Research Council of Canada. Nanotechnology
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| Format | Text, Article |
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| Subject | Hole Free Phase Plate (HFPP); electron tomography; transistor Imaging; molecular electronic junction; interface roughness; Transmission electron microscope (TEM) |
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| Abstract | We report, for the first time, the three dimensional reconstruction (3D) of a transistor from a microprocessor chip and roughness of molecular electronic junction obtained by electron tomography with Hole Free Phase Plate (HFPP) imaging. The HFPP appears to enhance contrast between inorganic materials and also increase the visibility of interfaces between different materials. We demonstrate that the degree of enhancement varies depending on material and thickness of the samples using experimental and simulation data. |
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| Publication date | 2018-09-07 |
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| Publisher | Elsevier |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23004075 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 470fa7e1-607b-48ee-bc92-a7ddd422ffc6 |
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| Record created | 2018-09-25 |
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| Record modified | 2020-03-16 |
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