| DOI | Resolve DOI: https://doi.org/10.1051/matecconf/20130802004 |
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| Author | Search for: Mercadier, L.1; Search for: Peng, J.1; Search for: Sultan, Y.; Search for: Davis, T.; Search for: Rayner, D.M.1; Search for: Corkum, P.B.1 |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Conference | Workshop on Progress in Ultrafast Laser Modifications of Materials, 2013, 14 April 2013 through 19 April 2013, Cargese |
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| Subject | Atomic force microscopy; Polymer films; Semiconducting films; Ultrashort pulses; Beam geometry; Dielectric surface; Thin polymer films; Two ways; Ultrafast lasers |
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| Abstract | We desorb polymer films from fused silica with a femtosecond laser and characterize the results by atomic force microscopy. Our study as a function of beam geometry and energy reveals two ways of achieving spatially controlled nanodesorption. © Owned by the authors, published by EDP Sciences, 2013. |
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| Publication date | 2013 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21276253 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 431c2f5d-db1a-43b8-9047-d755957db1c2 |
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| Record created | 2015-09-28 |
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| Record modified | 2020-04-22 |
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