Quantum metrology with photoelectrons, volume 3: analysis methodologies
Quantum metrology with photoelectrons, volume 3: analysis methodologies
| DOI | Resolve DOI: https://doi.org/10.1088/978-0-7503-5022-8 |
|---|---|
| Author | Search for: 1; Search for: |
| Affiliation |
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| Format | Text, Book |
| ISBN | 978-0-7503-5022-8 978-0-7503-5020-4 |
| Abstract | |
| Publication date | 2023-12-01 |
| Publisher | IOP Publishing |
| Language | English |
| Peer reviewed | Yes |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 271b0337-8b4f-426f-b452-15f22f6ae138 |
| Record created | 2024-06-24 |
| Record modified | 2024-06-24 |
- Date modified: