Quantum metrology with photoelectrons, volume 3: analysis methodologies
Quantum metrology with photoelectrons, volume 3: analysis methodologies
DOI | Resolve DOI: https://doi.org/10.1088/978-0-7503-5022-8 |
---|---|
Author | Search for: 1; Search for: |
Affiliation |
|
Format | Text, Book |
ISBN | 978-0-7503-5022-8 978-0-7503-5020-4 |
Abstract | |
Publication date | 2023-12-01 |
Publisher | IOP Publishing |
Language | English |
Peer reviewed | Yes |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 271b0337-8b4f-426f-b452-15f22f6ae138 |
Record created | 2024-06-24 |
Record modified | 2024-06-24 |
- Date modified: