Photonic temperature and wavelength metrology by spectral pattern recognition

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DOIResolve DOI: https://doi.org/10.1364/OE.394642
AuthorSearch for: 1; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0002-0490-5224; Search for: 2; Search for: 3; Search for: 3; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0003-2151-2438; Search for: 1ORCID identifier: https://orcid.org/0000-0002-3427-0186
Affiliation
  1. National Research Council of Canada. Advanced Electronics and Photonics
  2. National Research Council of Canada. Herzberg Astronomy and Astrophysics
  3. National Research Council of Canada. Metrology Research Centre
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LanguageEnglish
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Record identifier0786cc88-5e41-4e0d-8982-aeb0f6c91427
Record created2020-06-29
Record modified2022-03-22
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