Photonic temperature and wavelength metrology by spectral pattern recognition

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DOIResolve DOI: https://doi.org/10.1364/OE.394642
AuthorSearch for: 1; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0002-0490-5224; Search for: 2; Search for: 3; Search for: 3; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0003-2151-2438; Search for: 1ORCID identifier: https://orcid.org/0000-0002-3427-0186
Name affiliation
  1. National Research Council of Canada. Advanced Electronics and Photonics
  2. National Research Council of Canada. Herzberg Astronomy and Astrophysics
  3. National Research Council of Canada. Metrology Research Centre
FormatText, Article
Journal titleOptics Express
ISSN1094-4087
Volume28
Issue12
Pages1740917423
Abstract
Publication date
PublisherOSA Publishing
LanguageEnglish
Peer reviewedYes
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Record identifier0786cc88-5e41-4e0d-8982-aeb0f6c91427
Record created2020-06-29
Record modified2020-06-30
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