| Auteur | Rechercher : Malac, Marek1; Rechercher : Wang, Carol1; Rechercher : Egerton, Ray1 |
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| Affiliation | - Conseil national de recherches Canada. Technologies de sécurité et de rupture
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| Format | Texte, Allocution |
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| Conférence | Presented at the Center for Functional Nanomaterials, Brookhaven National Laboratory, May 21st, 2012, Upton, New York |
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| Résumé | Electron energy loss spectroscopy (EELS) has become a mainstream characterization method. It provides access to high spatial resolution analytical and electronic properties information in a TEM. When combined with the imaging and diffraction capabilities of a TEM a nanomaterial can be characterized in great detail. The aim is to review the principles and implementation of angle- and spatially-resolved EELS and its applications to study of material properties at nanoscale. Fundamental limits imposed on momentum and spatial resolution will be discussed. |
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| Date de publication | 2012-05-21 |
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| Langue | anglais |
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| Publications évaluées par des pairs | Non |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | e8794421-2cff-40fa-aba2-425e585a9bb6 |
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| Enregistrement créé | 2020-10-15 |
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| Enregistrement modifié | 2020-10-15 |
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