| Téléchargement | - Voir la version finale : Lock-in amplitude-phase correlations in coherent Raman microscopy: application to lithium ores (PDF, 15.0 Mio)
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| DOI | Trouver le DOI : https://doi.org/10.1117/12.3042075 |
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| Auteur | Rechercher : Harper, AlexanderIdentifiant ORCID : https://orcid.org/0000-0002-0463-3900; Rechercher : Boisvert, Jonathan1Identifiant ORCID : https://orcid.org/0000-0002-4161-3968; Rechercher : Shivkumar, SiddarthIdentifiant ORCID : https://orcid.org/0000-0001-9657-9755; Rechercher : Frackleton, Leah; Rechercher : Latorre, Malcolm; Rechercher : Grammatikopoulos, Tassos; Rechercher : Pegoraro, Adrian2Identifiant ORCID : https://orcid.org/0000-0003-3334-227X; Rechercher : Stolow, Albert3Identifiant ORCID : https://orcid.org/0000-0002-8447-3678 |
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| Éditeur | Rechercher : Brown, Thomas G.; Rechercher : Wilson, Tony; Rechercher : Waller, Laura |
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| Affiliation | - Conseil national de recherches Canada. Technologies numériques
- Conseil national de recherches Canada. Centre de recherche en métrologie
- Conseil national de recherches Canada. Quantique et nanotechnologies
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| Format | Texte, Article |
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| Conférence | Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXII, January 29-30, 2025, San Francisco, California, United States |
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| Sujet | Stimulated Raman Scattering microscopy; nonlinear optical microscopy; pump-probe microscopy; SRS microscopy background processes; Spectral Focusing; Lock-In Amplification; Amplitude-Phase correlations |
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| Résumé | In Stimulated Raman Scattering (SRS) Microscopy, which is typically based on modulation transfer techniques, the Lock-In amplitude and phase provide easily measured, complementary information. This information characterizes both the strength of a signal and the lifetime of the underlying process on a per-pixel basis. Despite these advantages, interpreting the phase information becomes challenging when several nonlinear optical processes occur simultaneously, as is particularly noticeable when pump-probe type signals are present. Here, we use spectral focusing SRS Microscopy to characterize a lithium ore sample. Spectral focusing SRS microscopy is based on linearly chirping the input pulses so as to achieve high Raman spectral resolution through the narrowed instantaneous bandwidth. By scanning the inter-pulse time delay, the instantaneous difference frequency and consequently, the Raman shift probed is tuned. Unfortunately, this also makes the process sensitive to delayed pump-probe signals, as shown here for lithium ore samples. We show that by using both phase and amplitude lock-in amplifier information, we can fully characterize the competing nonlinear processes which contribute during a pump-probe time-delay scan. |
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| Date de publication | 2025-03-19 |
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| Maison d’édition | Society of Photo-Optical Instrumentation Engineers (SPIE) |
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| Licence | - Copyright 2025 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | d7678c4e-39f2-4181-9e7a-ee3c32941163 |
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| Enregistrement créé | 2025-05-06 |
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| Enregistrement modifié | 2025-05-06 |
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