Automated absolute and relative spectral linearity measurements on photovoltaic detectors

DOI	Trouver le DOI : https://doi.org/10.1088/0026-1394/30/4/025
Auteur	Rechercher : Boivin, L.-P.¹
Affiliation	Conseil national de recherches Canada. Institut des étalons nationaux de mesure du CNRC
Format	Texte, Article
Conférence	New Developments and Applications in Optical Radiometry IV, NEWRAD '92, October 5-7, 1992, Baltimore, Maryland, United States
Résumé	The paper discusses automated spectral linearity measurements using both absolute and relative methods. Results of measurements on typical silicon and germanium photodiodes are presented. These measurements show the agreement between the two methods. They also illustrate some interesting linearity properties: wavelength dependence, detector-to-detector variation, current versus current-density dependence, geometrical effects, and effect of reverse bias. In particular, it is shown that some silicon and germanium detectors must be underfilled with radiation to avoid edge effects. These cause nonlinearities which are generally small (1% level) but, in certain types of thermoelectrically cooled germanium detectors, can be very large (8% to 10%).
Date de publication	1993
Dans	Metrologia 30, nº 4 (1993) : 355–360.
Langue	anglais
Numéro du CNRC	NRC-INMS-426
Numéro NPARC	8900169
Exporter la notice	Exporter en format RIS
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Identificateur de l’enregistrement	ca2bd6e4-d3ad-4877-802e-5baabf422d20
Enregistrement créé	2009-04-22
Enregistrement modifié	2024-03-06