| DOI | Trouver le DOI : https://doi.org/10.1063/1.3154550 |
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| Auteur | Rechercher : Fritzsche, Helmut1; Rechercher : Ophus, Colin2; Rechercher : Harrower, Chris T.2; Rechercher : Luber, Erik2; Rechercher : Mitlin, David2 |
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| Affiliation | - Conseil national de recherches Canada. Institut Steacie des sciences moléculaires du CNRC
- Conseil national de recherches Canada. Nanotechnologie
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| Format | Texte, Article |
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| Sujet | neutron reflectometry; reflectometry; hydrogen storage; metal oxides; x-ray diffraction; thin films; chemical compounds and components; chemical elements; surface and interface chemistry; catalyst |
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| Résumé | We used a nanoscale (5 nm Ta/5 nm Pd) bilayer catalyst to achieve remarkable desorption kinetics for thin films. Full hydrogen desorption occurred at 100 °C with a noticeable desorption even at room temperature. This is a significant improvement relative to the 175 °C needed to fully desorb an identical film with a single Pd layer acting as the catalyst. Neutron reflectometry confirmed that the Ta/Pd bilayer remained intact both after hydrogen absorption and following the hydrogen desorption. We used x-ray diffraction analysis to gather complementary information regarding the crystal structure of the as-synthesized, sorbed and desorbed film. |
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| Date de publication | 2009-06-15 |
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| Maison d’édition | AIP |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 23005069 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | ba5b5266-8bd0-4660-a123-bd79883c7b00 |
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| Enregistrement créé | 2019-02-21 |
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| Enregistrement modifié | 2020-04-16 |
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