DOI | Trouver le DOI : https://doi.org/10.1063/1.3049133 |
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Auteur | Rechercher : Grojo, D.1; Rechercher : Gertsvolf, M.2; Rechercher : Jean-Ruel, H.1; Rechercher : Lei, S.; Rechercher : Ramunno, L.; Rechercher : Rayner, D.M.2; Rechercher : Corkum, P.B.2 |
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Affiliation | - Conseil national de recherches du Canada. Institut Steacie des sciences moléculaires du CNRC
- Conseil national de recherches du Canada
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Format | Texte, Article |
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Sujet | Corundum; Electromagnetic pulse; Gallium alloys; Lenses; Mica; Microlenses; Optical instruments; Optical properties; Refractive index; Semiconductor materials; Silica; Silicate minerals; Silicon compounds; Ultrashort pulses; Common features; Defocusing; Focused femtosecond pulses; Lens formations; Linear absorptions; Linearly polarized lights; Material modifications; Nano cracks; Optical breakdowns; Subwavelength periodic structures; Transparent materials; Fused silica |
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Résumé | By repeatedly illuminating fused silica slabs with focused femtosecond pulses, we permanently decrease the local refractive index without increasing the linear absorption or scattering. This progressively forms a biconvex lens in the prefocal region. With linearly polarized light, the index change reaches several percent and is associated with the formation of an array of planar nanocracks. We analyze the polarization-dependent focusing power of the subwavelength periodic structure. While the detailed material modification changes, spontaneous defocusing lens formation is a common feature of every wide-band-gap transparent materials that we have studied (SiO2, BK7, LiF, sapphire, and mica). © 2008 American Institute of Physics. |
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Date de publication | 2008 |
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Dans | |
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Langue | anglais |
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Publications évaluées par des pairs | Oui |
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Numéro NPARC | 21276247 |
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Exporter la notice | Exporter en format RIS |
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Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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Identificateur de l’enregistrement | 81e92357-3d2c-43ca-8b7f-44a2813e80ac |
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Enregistrement créé | 2015-09-28 |
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Enregistrement modifié | 2020-04-15 |
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