| DOI | Trouver le DOI : https://doi.org/10.1117/12.2290540 |
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| Auteur | Rechercher : Waqas, Abi; Rechercher : Melati, Daniele1; Rechercher : Mushtaq, Zarlish; Rechercher : Melloni, Andrea I. |
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| Éditeur | Rechercher : García-Blanco, Sonia M.; Rechercher : Cheben, PavelIdentifiant ORCID : https://orcid.org/0000-0003-4232-9130 |
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| Affiliation | - Conseil national de recherches du Canada. Électronique et photonique avancées
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| Format | Texte, Article |
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| Conférence | Integrated Optics: Devices, Materials, and Technologies XXII, January 27 - February 1, 2018, San Francisco, United States |
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| Sujet | integrated photonic; generalized polynomial chaos (gPC); stochastic process |
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| Résumé | Unavoidable statistical variations in fabrication processes have a strong effect on the functionality of fabricated photonic circuits and on fabrication yield. It is hence essential to measure and consider these uncertainties during the design in order to predict the statistical behavior of the realized circuits. Also, during the mass production of photonic integrated circuits, the experimental evaluation of circuits’ desired quantity of interest in the presence of fabrication error can be crucial. In this paper we proposed the use of generalized polynomial chaos method to estimate the statistical properties of a circuit from a reduced number of experimental data whilst achieving good accuracy comparable to those obtained by Monte Carlo. |
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| Date de publication | 2018-03-01 |
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| Maison d’édition | SPIE |
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| Dans | |
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| Série | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 23002831 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 753e16f4-1318-4cc9-ac16-7560cddebdb9 |
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| Enregistrement créé | 2018-03-08 |
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| Enregistrement modifié | 2020-03-16 |
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