| DOI | Trouver le DOI : https://doi.org/10.1016/j.jeurceramsoc.2021.04.046 |
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| Auteur | Rechercher : Zhang, B.; Rechercher : Chen, Kuiying1; Rechercher : Baddour, N.Identifiant ORCID : https://orcid.org/0000-0002-7025-7501 |
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| Affiliation | - Conseil national de recherches Canada. Aérospatiale
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| Bailleur de fonds | Rechercher : National Research Council Canada; Rechercher : Natural Sciences and Engineering Research Council of Canada |
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| Format | Texte, Article |
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| Sujet | EB-PVD TBC; stress model; finite element; temperature-process dependent model parameters; failure mechanism analysis |
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| Résumé | This article presents a new stress model for EB-PVD TBC to provide insight into TBC failure mechanisms. Cycling-induced and temperature-process dependent model parameters are incorporated into stress analysis of EB-PVD TBC and then used to simulate the variation of mechanical, thermal and inelastic behaviour from metallic bond coat to thermally grown oxide (TGO). This gives a smooth evolution of residual stresses and is more realistic than prior finite element (FE) work. Two types of interfacial roughness approximate profiles are presented and implemented in the FE model. Geometrical parameters are used to model the interface roughness, and residual stresses are then evaluated at specific positions within TBCs. This article's stress analysis establishes a link between stress distribution and the evolution of interfacial roughness during thermal cycles. Consequently, the results are expected to provide insight into the failure modes related to localized interfacial roughness evolution. |
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| Date de publication | 2021-04-28 |
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| Maison d’édition | Elsevier |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Identificateur | S0955221921002995 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 699101da-6ab7-4d96-bf2f-5108678a69e9 |
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| Enregistrement créé | 2023-05-02 |
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| Enregistrement modifié | 2025-11-03 |
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