| DOI | Trouver le DOI : https://doi.org/10.1557/PROC-0928-GG10-05 |
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| Auteur | Rechercher : Gospodyn, James; Rechercher : Taschuk, Michael T.; Rechercher : Hrudey, Peter C. P.; Rechercher : Tsui, Ying Y.; Rechercher : Fedosejevs, Robert; Rechercher : Brett, Michael J.; Rechercher : Sit, Jeremy C. |
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| Format | Texte, Article |
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| Sujet | luminescence; optical properties; photoemission |
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| Résumé | Periodic high-/low-index film stacks of Y2O3:Eu were grown with varying periodicities us-ing the glancing angle deposition (GLAD) technique onto silicon and fused silica substrates. Post-deposition annealing at temperatures from 600 to 1000°C for 1 hour in atmosphere was per-formed to enhance the photoluminescent output of the films. The films were optically character-ized using transmission measurements and Mueller matrix ellipsometry. The luminescence was measured using a spectrometer calibrated for absolute intensity measurements using a frequency-quadrupled Nd:YAG pulsed laser as an excitation source. Absolute conversion efficiencies were measured for the films by characterizing the angular emission profile. The angular emission pro-file of the films was found to follow a non-Lambertian emission profile, with peak emission in-tensities at 50° to 60° with respect to the substrate normal. |
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| Date de publication | 2006-09-01 |
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| Maison d’édition | Springer |
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| Dans | |
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| Série | |
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| Publications évaluées par des pairs | Oui |
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| Numéro du CNRC | NRC-NINT-269 |
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| Numéro NPARC | 8926139 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 208be9a7-9702-4ea3-a469-93f5ba17bc17 |
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| Enregistrement créé | 2009-04-23 |
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| Enregistrement modifié | 2023-03-15 |
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