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Infrared ellipsometry of GaAs epilayers on Si(100)

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.1561577
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FormatText, Article
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  • Applied Physics Letters 82, no. March 17 11 (17 March 2003): 1730–1732.
LanguageEnglish
NRC numberNRC-INMS-352
NPARC number8896488
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Record identifierfe858d36-4abc-4934-8be2-9e3d428c94dd
Record created2009-04-22
Record modified2020-04-02
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