High precision control of galvanometer scanner

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DOIResolve DOI: https://doi.org/10.1117/12.967406
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  1. National Research Council of Canada
FormatText, Article
Conference31st Symposium on Optical Optoelectronic Science Engineering, August 16-21, 1987, San Diego, California, USA
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NoteMr. Blais was affiliated with the National Research Council of Canada, Division of Electronical Engineering when he authored this article.
LanguageEnglish
Peer reviewedYes
NRC numberNRCC 28048
NPARC number5763989
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Record identifierfe121c89-9b75-43dc-bd43-a7d15d296e36
Record created2009-03-29
Record modified2020-03-17
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