Effect of sol stabilizer on the structure and electronic properties of solution-processed ZnO thin films

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DOIResolve DOI: https://doi.org/10.1039/C5RA18642K
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  1. National Research Council of Canada. Security and Disruptive Technologies
FormatText, Article
Publication date
PublisherRoyal Society of Chemistry
Peer reviewedYes
NPARC number23000983
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Record identifierfd54e88c-f5c0-4d92-b881-1344f71123d8
Record created2016-11-24
Record modified2020-06-02
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