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Phase plates in the transmission electron microscope: operating principles and applications

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1093/jmicro/dfaa070
AuthorSearch for: 1ORCID identifier: https://orcid.org/0000-0001-7907-3867; Search for: ; Search for: 1; Search for: ; Search for: ; Search for:
Affiliation
  1. National Research Council of Canada. Nanotechnology
FormatText, Article
Subjecthole-free phase plate (HFPP); Volta plase plate (VPP); radiation damage; electron beam-induced sample charging; sample contamination; cryo electron microscopy
Abstract
In this paper, we review the current state of phase plate imaging in a transmission electron microscope. We focus especially on the hole-free phase plate design, also referred to as the Volta phase plate. We discuss the implementation, operating principles and applications of phase plate imaging. We provide an imaging theory that accounts for inelastic scattering in both the sample and in the hole-free phase plate.
Publication date
PublisherOxford University Press
Japanese Society of Microscopy
In
  • Microscopy 70, no. 1: 75–115.
LanguageEnglish
Peer reviewedYes
NRC numberNRC-NANO-092
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Record identifierf20986c3-c487-4381-b84a-de1df852a8f2
Record created2021-02-23
Record modified2021-02-23
Date modified: