A semi-automatic workflow for atomic force microscopy image analysis and cellulose nanocrystal particle size measurements

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1007/s10570-025-06690-w
AuthorSearch for: ORCID identifier: https://orcid.org/0000-0002-7287-604X; Search for: ORCID identifier: https://orcid.org/0000-0001-9911-3459; Search for: ORCID identifier: https://orcid.org/0000-0001-9526-0953; Search for: 1ORCID identifier: https://orcid.org/0000-0002-9136-4920; Search for: ORCID identifier: https://orcid.org/0000-0001-5718-0493; Search for: ORCID identifier: https://orcid.org/0000-0001-6880-7765; Search for: 2ORCID identifier: https://orcid.org/0000-0002-1868-6464; Search for: ORCID identifier: https://orcid.org/0000-0001-6909-7507
Affiliation
  1. National Research Council Canada. Metrology Research Centre
  2. National Research Council Canada. Quantum and Nanotechnologies
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PublisherSpringer
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LanguageEnglish
Peer reviewedYes
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Record created2025-09-09
Record modified2025-09-09
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