Download | - View final version: High-temperature online monitoring of 3D printing of thermoplastic polymers using SS-OCT technology with an air-cooled piezoelectric scanner (PDF, 1.2 MiB)
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DOI | Resolve DOI: https://doi.org/10.1117/12.3041953 |
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Author | Search for: Carignan, Louis-Philippe1ORCID identifier: https://orcid.org/0000-0002-9383-3874; Search for: Rivard, Maxime1ORCID identifier: https://orcid.org/0000-0001-8624-8768; Search for: Padioleau, Christian2; Search for: Djupkep Dizeu, Frank Billy1ORCID identifier: https://orcid.org/0000-0002-0267-9163; Search for: Mihai, Mihaela3ORCID identifier: https://orcid.org/0000-0001-5888-3537; Search for: Beragrag, Tarik3; Search for: Lamouche, Guy1ORCID identifier: https://orcid.org/0000-0002-9831-8273 |
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Editor | Search for: Scheuer, Jacob |
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Affiliation | - National Research Council of Canada. Digital Technologies
- National Research Council of Canada. Clean Energy Innovation
- National Research Council of Canada. Automotive and Surface Transportation
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Funder | Search for: PRIMA-Québec |
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Format | Text, Article |
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Conference | Optical Sensing and Precision Metrology, January 28-31, 2025, San Francisco, California, United States |
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Subject | 3D printing; thermoplastics; online inspection; optical coherence tomography; piezoelectric scanner |
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Abstract | An inspection system based on swept-source optical coherence tomography technology using an air-cooled piezoelectric scanner was developed for the online monitoring of a high-temperature 3D printing of a thermoplastic composite. The scanner operation was characterized and validated at various temperatures up to 120 °C. The continuous online monitoring of a 3D part printing demonstrated the value of the inspection system by highlighting the appearance of voids in intermediate layers, anomalies which would normally have been unnoticed since the upper layers showed excellent coverage. |
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Publication date | 2025-03-19 |
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Publisher | Society of Photo‑Optical Instrumentation Engineers (SPIE) |
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Licence | - Copyright 2025 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.
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Language | English |
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Peer reviewed | Yes |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | e9926f06-c5ba-4c86-9ca6-1559d8e6fe72 |
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Record created | 2025-01-29 |
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Record modified | 2025-04-03 |
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