Inelastic light scattering spectroscopy in si/SiGe nanostructures: strain, chemical composition and thermal properties
Inelastic light scattering spectroscopy in si/SiGe nanostructures: strain, chemical composition and thermal properties
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DOI | Resolve DOI: https://doi.org/10.1016/j.ssc.2016.07.008 |
Author | Search for: Tsybeskov, L.; Search for: Mala, S. A.; Search for: Wang, X.; Search for: Baribeau, J.-M.1; Search for: Wu, X.1; Search for: Lockwood, D. J.2 |
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Format | Text, Article |
Journal title | Solid State Communications |
ISSN | 0038-1098 1879-2766 |
Subject | Nanostructures; Molecular Beam Epitaxy; Inelastic Light Scattering; Raman Scattering |
Abstract | |
Publication date | 2016-07-09 |
Publisher | Elsevier |
Language | English |
In press | Yes |
Peer reviewed | Yes |
NPARC number | 23000477 |
Export citation | Export as RIS |
Report a correction | Report a correction |
Record identifier | e7469215-77b6-45da-b380-175305bd4da2 |
Record created | 2016-07-22 |
Record modified | 2020-06-04 |