Inelastic light scattering spectroscopy in si/SiGe nanostructures: strain, chemical composition and thermal properties

From National Research Council Canada

Download
  1. (PDF, 766 KB)
DOIResolve DOI: https://doi.org/10.1016/j.ssc.2016.07.008
AuthorSearch for: ; Search for: ; Search for: ; Search for: 1 ; Search for: 1 ; Search for: 2 
Name affiliation
  1. National Research Council Canada. Information and Communication Technologies
  2. National Research Council Canada. Measurement Science and Standards
FormatText
TypeArticle
Journal titleSolid State Communications
ISSN0038-1098
1879-2766
SubjectNanostructures; Molecular Beam Epitaxy; Inelastic Light Scattering; Raman Scattering
Abstract
We present a review of recent studies of inelastic light scattering spectroscopy in two types of Si/SiGe nanostructures: planar superlattices and cluster (dot) multilayers including first- and second-order Raman scattering, polarized Raman scattering and low-frequency inelastic light scattering associated with folded acoustic phonons. The results are used in semi-quantitative analysis of chemical composition, strain and thermal conductivity in these technologically important materials for electronic and optoelectronic devices.
Publication date
PublisherElsevier
LanguageEnglish
In pressYes
Peer reviewedYes
NPARC number23000477
Export citationExport as RIS
Report a correctionReport a correction
Record identifiere7469215-77b6-45da-b380-175305bd4da2
Record created2016-07-22
Record modified2016-07-22
Date modified:
Report a problem on this page