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Stress induced birefringence in silicon-on-insulator SOI waveguides

From National Research Council Canada

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Affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText, Article
PublisherSPIE
In
  • Optoelectronic Integration on Silicon II.
NPARC number12346742
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Record identifiere2a01e75-3139-41d9-9055-5e42ed646957
Record created2009-09-17
Record modified2020-04-16
Date modified: