XAFS and X-ray Reflectivity Study of III-V Compound Native Oxide/GaAs Interfaces
XAFS and X-ray Reflectivity Study of III-V Compound Native Oxide/GaAs Interfaces
| DOI | Resolve DOI: https://doi.org/10.1107/S0909049501001248 |
|---|---|
| Author | Search for: ; Search for: ; Search for: ; Search for: ; Search for: |
| Format | Text, Article |
| Publication date | 2001 |
| In | |
| NPARC number | 12743780 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | e223db3c-af86-4bec-bb83-606a8e4af928 |
| Record created | 2009-10-27 |
| Record modified | 2020-03-27 |
- Date modified: