Extending chi-squared statistics for key comparisons in metrology
Extending chi-squared statistics for key comparisons in metrology
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Format | Text, Article |
Conference | Proceedings of the 2004 International Conference on Computational and Mathematical Methods in Science and Engineering (CMMSE 2004), June 4-8, 2004, Uppsala, Sweden |
Language | English |
NRC number | NRC-INMS-773 |
NPARC number | 5764833 |
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Record identifier | e0de74f2-efa1-40e8-9b46-dd9654f840c4 |
Record created | 2009-03-29 |
Record modified | 2020-04-16 |
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