Atomic white-out: enabling atomic circuitry through mechanically induced bonding of single hydrogen atoms to a silicon surface

From National Research Council Canada

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DOI	Resolve DOI: https://doi.org/10.1021/acsnano.7b04238
Author	Search for: Huff, Taleana R.; Search for: Labidi, Hatem¹; Search for: Rashidi, Mohammad¹; Search for: Koleini, Mohammad¹; Search for: Achal, Roshan; Search for: Salomons, Mark H.¹; Search for: Wolkow, Robert A.¹
Name affiliation	National Research Council of Canada. National Institute for Nanotechnology
Format	Text, Article
Journal title	ACS Nano
ISSN	1936-0851 1936-086X
Volume	11
Issue	9
Pages	8636–8642
Subject	AFM; dangling bonds; mechanochemistry; nanofabrication; nanolithography; nanostructures; silicon
Abstract	We report the mechanically induced formation of a silicon–hydrogen covalent bond and its application in engineering nanoelectronic devices. We show that using the tip of a noncontact atomic force microscope (NC-AFM), a single hydrogen atom could be vertically manipulated. When applying a localized electronic excitation, a single hydrogen atom is desorbed from the hydrogen-passivated surface and can be transferred to the tip apex, as evidenced from a unique signature in frequency shift curves. In the absence of tunnel electrons and electric field in the scanning probe microscope junction at 0 V, the hydrogen atom at the tip apex is brought very close to a silicon dangling bond, inducing the mechanical formation of a silicon–hydrogen covalent bond and the passivation of the dangling bond. The functionalized tip was used to characterize silicon dangling bonds on the hydrogen–silicon surface, which was shown to enhance the scanning tunneling microscope contrast, and allowed NC-AFM imaging with atomic and chemical bond contrasts. Through examples, we show the importance of this atomic-scale mechanical manipulation technique in the engineering of the emerging technology of on-surface dangling bond based nanoelectronic devices.
Publication date	2017-07-18
Publisher	American Chemical Society
Language	English
Peer reviewed	Yes
NPARC number	23002386
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Record identifier	dab42061-686c-4973-9e25-a7ae29497615
Record created	2017-10-26
Record modified	2020-05-30

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Date modified:: 2020-10-01