| DOI | Resolve DOI: https://doi.org/10.1049/el:19940822 |
|---|
| Author | Search for: Beaulieu, Y.1; Search for: Webb, J. B.1; Search for: Brebner, J. L. |
|---|
| Affiliation | - National Research Council Canada. NRC Institute for Microstructural Sciences
|
|---|
| Format | Text, Article |
|---|
| Subject | crystal quality; film thickness; InSb/GaAs heterostructures; lattice-mismatched heterostructures; layer thickness; lineshape broadening; photoreflectance spectra; structural quality |
|---|
| Abstract | The photoreflectance spectra of InSb/GaAs heterostructures at the E₁ and E₁ +Δ₁ transitions have been measured as a function of layer thickness. The spectra show an increase in lineshape broadening, similar to that observed in the increase in FWHM of the X-ray diffraction peaks, as the film thickness decreases. The data indicate increased crystal quality with increasing layer thickness. The results show that photoreflectance can be used as a tool to study the structural quality of lattice-mismatched heterostructures. |
|---|
| Publication date | 1994-07-21 |
|---|
| In | |
|---|
| Language | English |
|---|
| NPARC number | 12327109 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | da86c665-2091-4e74-9910-d4f4205bd9ec |
|---|
| Record created | 2009-09-10 |
|---|
| Record modified | 2020-04-27 |
|---|
