Lock-in amplitude-phase correlations in coherent Raman microscopy: application to lithium ores

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DOIResolve DOI: https://doi.org/10.1117/12.3042075
AuthorSearch for: ORCID identifier: https://orcid.org/0000-0002-0463-3900; Search for: 1ORCID identifier: https://orcid.org/0000-0002-4161-3968; Search for: ORCID identifier: https://orcid.org/0000-0001-9657-9755; Search for: ; Search for: ; Search for: ; Search for: 2ORCID identifier: https://orcid.org/0000-0003-3334-227X; Search for: 3ORCID identifier: https://orcid.org/0000-0002-8447-3678
EditorSearch for: Brown, Thomas G.; Search for: Wilson, Tony; Search for: Waller, Laura
Affiliation
  1. National Research Council Canada. Digital Technologies
  2. National Research Council Canada. Metrology Research Centre
  3. National Research Council Canada. Quantum and Nanotechnologies
FormatText, Article
ConferenceThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXII, January 29-30, 2025, San Francisco, California, United States
SubjectStimulated Raman Scattering microscopy; nonlinear optical microscopy; pump-probe microscopy; SRS microscopy background processes; Spectral Focusing; Lock-In Amplification; Amplitude-Phase correlations
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PublisherSociety of Photo-Optical Instrumentation Engineers (SPIE)
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  • Copyright 2025 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.
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LanguageEnglish
Peer reviewedYes
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Record identifierd7678c4e-39f2-4181-9e7a-ee3c32941163
Record created2025-05-06
Record modified2025-05-06
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