Second-order susceptibility measurement of thin films by reflective second harmonic generation method - toward measurement standards in nonlinear optics
Second-order susceptibility measurement of thin films by reflective second harmonic generation method - toward measurement standards in nonlinear optics
| Author | Search for: 1; Search for: |
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| Format | Text, Article |
| Publication date | 2004 |
| Series | |
| Language | English |
| Peer reviewed | Yes |
| NPARC number | 12346795 |
| Export citation | Export as RIS |
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| Record identifier | cbb8486d-ce57-4890-84ed-51fde66ba6b5 |
| Record created | 2009-09-17 |
| Record modified | 2023-06-22 |
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