ADF-STEM imaging of strained GaN0045As0955 epitaxial layers on 100 GaAs substrates

Author	Search for: Wu, X.; Search for: Robertson, M.; Search for: Gupta, J.; Search for: Baribeau, J-M; Search for: Bennett, J.; Search for: Kawasaki, M.; Search for: Aoki, T.
Format	Text, Article
Conference	Mater Res Soc Sym
NPARC number	12346425
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Record identifier	c0eb470e-78b9-44e3-8a1e-c791c9c6c7f4
Record created	2009-09-17
Record modified	2020-04-16