Vectorized optoelectronic control and metrology in a semiconductor

From National Research Council Canada

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DOIResolve DOI: https://doi.org/10.1038/s41566-020-0690-1
AuthorSearch for: 1ORCID identifier: https://orcid.org/0000-0001-8118-1445; Search for: 1; Search for: ; Search for: 1; Search for: ORCID identifier: https://orcid.org/0000-0002-8168-7304; Search for: 1
Affiliation
  1. National Research Council of Canada. Security and Disruptive Technologies
FormatText, Article
Subjectoptical metrology; optoelectronic devices and components; ultrafast photonics
Abstract
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PublisherNature Research
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LanguageEnglish
Peer reviewedYes
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Record identifierbb50aa58-8441-4099-9863-41b62cf0c6f8
Record created2020-12-24
Record modified2020-12-24
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