| DOI | Resolve DOI: https://doi.org/10.1016/j.micron.2016.09.010 |
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| Author | Search for: Hayashida, Misa1; Search for: Malac, Marek1 |
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| Affiliation | - National Research Council of Canada. Nanotechnology
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| Format | Text, Article |
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| Subject | electron tomography; sample preparation; radiation damage; missing wedge; high accuracy alignment; title angle measurement; volume reconstruction; image segmentation; volume projection |
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| Abstract | We present a review of the recent progress in electron tomography applicable to materials science samples. We focus on practical high accuracy tomographic measurements and their applications. We follow the steps leading to a reconstructed 3D volume and discuss the effect of the individual steps on the suitability of the resulting 3D volume for quantitative measurements. Both the progress in applications and new opportunities in electron tomography in materials science are reviewed. |
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| Publication date | 2016-09-28 |
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| Publisher | Elsevier |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b5220f31-6104-4bdc-b746-ab17e66cf3b8 |
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| Record created | 2020-01-09 |
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| Record modified | 2020-03-16 |
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