Engineering matrix-free laser desorption ionization mass spectrometry using glancing angle deposition films

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1002/rcm.7826
AuthorSearch for: 1; Search for: 2; Search for: 2; Search for: 2; Search for: 2; Search for: 2
Name affiliation
  1. National Research Council Canada. Human Health Therapeutics
  2. National Research Council Canada. Nanotechnology
FormatText
TypeArticle
Journal titleRapid Communications in Mass Spectrometry
ISSN0951-4198
1097-0231
Volume31
Issue7
Pages631–638
Abstract
Thin, nanoporous films fabricated using Glancing Angle Deposition (GLAD) technology are demonstrated for solid matrix laser desorption ionization mass spectrometry (SMALDI-MS). GLAD allows facile engineering of naonporosity, film thickness, post alignment, and material composition, as demonstrated here by the fabrication of Co-GLAD and Si-GLAD films for SMALDI, and by exploration of the SMALDI performance as a function of thickness, post density, and angle of the post relative to surface normal. GLAD films were prepared by electron beam evaporation onto silicon substrates, using steep angles of incidence for the vacuum deposition, with computer controlled substrate rotation. LDI from the GLAD films were evaluated using an MDS-Sciex time-of-flight (TOF) MALDI-MS. Co-GLAD films give 6 fmol limit of quantitation for complex carbohydrate derivatives, and slanted-post Si-GLAD films show up to 3 times higher sensitivity than vertical post structures. Reproducibility of both Si and Co films is much higher than conventional MALDI methods for m/z below at least 2100 Daltons. Both reproducibility and detection limits are comparable to or better than other nano-structured materials. Co-GLAD films are significantly better in performance than Co powders or Co thin films on silicon substrates previously evaluated. The flexibility of GLAD for thin film fabrication of LDI materials is demonstrated by the range of nanoporous materials that can be grown, and the fine control over structural conformation, thickness and porosity.
Publication date
PublisherWiley
LanguageEnglish
Peer reviewedYes
NPARC number23002376
Export citationExport as RIS
Report a correctionReport a correction
Record identifierb4d3084c-6240-4301-8752-ad1936946ed9
Record created2017-10-24
Record modified2020-03-16
Report a problem on this page
Date modified: