| Download | - View accepted manuscript: Frequency resolved high-harmonic wavefront characterization (PDF, 661 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1364/OL.34.003026 |
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| Author | Search for: Frumker, E.1; Search for: Paulus, G. G.; Search for: Niikura, H.1; Search for: Villeneuve, D. M.1; Search for: Corkum, P. B.1 |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Abstract | We introduce and demonstrate a novel concept of frequency-resolved wavefront characterization. Our approach is particularly suitable for high-harmonic, extreme-UV (XUV) and soft X-ray radiation. The concept is based on an analysis of radiation diffracted from a slit scanned in front of a flat-field XUV spectrometer. With the spectrally resolved signal spread across one axis and the spatially resolved diffraction pattern in the other dimension, we reconstruct the wavefront. While demonstrated for high harmonics, the method is not restricted in wavelength. |
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| Publication date | 2009-09-01 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 15203842 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b4274a09-6525-444f-9cc3-1e2e3efac04d |
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| Record created | 2010-07-12 |
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| Record modified | 2020-04-16 |
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