| DOI | Resolve DOI: https://doi.org/10.1017/S1431927614004863 |
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| Author | Search for: Malac, Marek1; Search for: Kimoto, Koji; Search for: Egerton, Ray1; Search for: Shekhar, Prashant; Search for: Jacob, Zubin; Search for: Taniguchi, Yoshifumi; Search for: Gaind, Vaibhav |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2014, August 3-7, 2014, Hartford, Connecticut, United States |
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| Abstract | Electron energy loss spectroscopy (EELS) in a TEM can measure the optical response of individual nanostructures at high spatial resolution [1] and obtain structure and morphology of the individual nanostructures. Here we show that high quality valence EELS (VEELS) can be acquired and interpreted to well below 2 eV in an instrument equipped with a cold field emission gun (CFEG) and a standard Gatan Image Filter (GIF) TridiemTM. We provide interpretation of the main spectral feature in the momentum-resolved EELS (qEELS) spectrum. |
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| Publication date | 2014-08-27 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b06b4cce-70fb-4888-8feb-91b099aa6269 |
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| Record created | 2020-02-29 |
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| Record modified | 2024-05-15 |
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