On the influence of gauge block roughness characteristic and surface treatment on length calibration by optical interferometry

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1117/12.614402
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SponsorSearch for: SPIE
FormatText, Article
ConferenceRecent developments in traceable dimensional measurements III, July 31-August 4, 2005, San Diego, California, USA
ISSN0277-786X
ISBN0819458848
LanguageEnglish
NRC numberNRC-INMS-2617
NPARC number8899972
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Record identifiera3ff85ec-31a4-4463-b370-2db5b31be122
Record created2009-04-22
Record modified2020-04-16
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