| DOI | Resolve DOI: https://doi.org/10.1063/1.450131 |
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| Author | Search for: Bancroft, G.M.; Search for: Aksela, S.; Search for: Aksela, H.; Search for: Tan, K.H.; Search for: Yates, B.W.; Search for: Coatsworth, L.L.; Search for: Tse, J.S.1 |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Subject | valence bands; band structure; kinetic theory; photoelectron spectroscopy; photons |
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| Abstract | Using monochromatized synchrotron radiation and angle integrated photoelectron spectroscopy, the Si 2p, Si L V V Auger, and F 2s cross sections have been obtained for SiF4 molecules in the gas phase between 116 and 150 eV photon energies. These cross sections and the Si 2p β value have also been calculated using the MS-Xα method. There is qualitative agreement between theory and experiment. Together with recent experimental and theoretical Si 2p cross sections from SiCl4 and valence band cross sections on SiF4, the two major resonances at 5 and 22 eV kinetic energies are assigned as t 2 resonances. The valence band branching ratios are not affected by interchannel coupling above the Si 2p threshold. |
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| Publication date | 1986 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRCC 24888 |
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| NPARC number | 21275086 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | a05b2b27-2380-406c-8ee3-7f6a498d4c85 |
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| Record created | 2015-05-07 |
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| Record modified | 2020-03-17 |
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