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Enhanced birefringence in vacuum evaporated silicon thin films

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1364/AO.43.005343
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Publication date
In
  • Applied Optics 43, no. 28 (2004): 5343–5349.
LanguageEnglish
Peer reviewedYes
NPARC number12744534
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Record identifier9dac7c6e-91ee-4329-87ba-edef012ddd4a
Record created2009-10-27
Record modified2023-06-22
Date modified: