| Alternative title | SPIE |
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| Author | Search for: Lefebvre, J.; Search for: Poole, Philip1; Search for: McCaffrey, John2; Search for: Lamontagne, Boris1; Search for: Aers, Geoffrey1; Search for: Lee, C.; Search for: Hu, S.; Search for: Williams, Robin1 |
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| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
- National Research Council of Canada. NRC Institute for National Measurement Standards
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| Format | Text, Article |
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| Conference | SPIE Optoelectronics Materials and Devices II, 2000, Taipei |
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| NPARC number | 12346529 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 8d99eeb7-e7b4-444f-a7b3-e1a9dd34adf8 |
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| Record created | 2009-09-17 |
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| Record modified | 2020-04-16 |
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