| DOI | Resolve DOI: https://doi.org/10.1017/S1431927614005753 |
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| Author | Search for: Hayashida, Misa; Search for: Malac, Marek1; Search for: Bergen, Mike; Search for: Li, Peng; Search for: Egerton, Ray1 |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2014, August 3-7, 2014, Hartford, Connecticut, United States |
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| Abstract | Electron tomography can provide three dimensional (3D) visualization of nanoscale objects in a transmission electron microscope (TEM) from a tilt series of projected images. The accuracy of the 3D reconstruction depends on quality of input parameters, including accurate alignment in real space and accuracy of tilt and azimuth angle measurements. Here we present an electron diffraction-based in-situ method that allows accurate measurement of the relative tilt (α) and azimuth (β) angles. |
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| Publication date | 2014-08-27 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 8b5fd8f1-5fcd-4d13-9189-4fca21b3d1d4 |
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| Record created | 2020-02-28 |
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| Record modified | 2024-05-15 |
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