A UHV deposition/reflectometer system for the deposition and characterization of XUV multilayer mirrors
A UHV deposition/reflectometer system for the deposition and characterization of XUV multilayer mirrors
| Author | Search for: 1 |
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| Affiliation |
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| Format | Text, Thesis |
| Publisher | Université du Québec, INRS |
| Language | English |
| NPARC number | 12339150 |
| Export citation | Export as RIS |
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| Record identifier | 891973f1-cc4f-49e4-a7e4-3171835f0ef4 |
| Record created | 2009-09-11 |
| Record modified | 2023-03-22 |
- Date modified: