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Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1103/PhysRevLett.87.236104
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Affiliation
  1. National Research Council Canada. NRC Steacie Institute for Molecular Sciences
FormatText, Article
Abstract
We have performed the most realistic simulation to date of the operation of a scanning tunneling microscope. Probe-sample distances from beyond tunneling to actual surface contact are covered. We simultaneously calculate forces, atomic displacements, and tunneling currents, allowing quantitative comparison with experimental values. A distance regime below which the probe becomes unstable is identified. It is shown that the real distance differs substantially from previous estimates because of large atomic displacements on the surface and at the probe tip.
Publication date
In
  • Physical Review Letters 87, no. 23 (December 2001): 236104-1–236104-4.
LanguageEnglish
NRC publication
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"Non-NRC publications" are publications authored by NRC employees prior to their employment by NRC.

NPARC number12339030
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Record identifier883598e5-d34c-4c2f-b4d4-f0cdb30bd102
Record created2009-09-11
Record modified2020-03-27
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