| DOI | Resolve DOI: https://doi.org/10.7567/JJAPS.32S2.134 |
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| Author | Search for: Tyliszczak, T.; Search for: Aebi, P.; Search for: Hitchcock, A. P.; Search for: Jackman, T. E.1; Search for: Baribeau, J-M.1; Search for: Lockwood, D. J.1 |
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| Name affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Conference | XAFS VII, the 7th International Conference on X-ray Absorption Fine Structure, August 23-29, 1992, Kobe, Japan |
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| Subject | EXAFS; multi-file analysis; Si-Ge interface; atomic-layer superlattices; epitaxy |
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| Abstract | Procedures for constrained simultaneous non-linear least squares curve fits of multiple EXAFS spectra are described and their advantages discussed. The techniques are illustrated by polarisation-dependent GeK EXAFS studies of buried Ge-Si interfaces in strained layer [(Si)m(Ge)n]p/Si(100) superlattices grown by molecular beam epitaxy (MBE). |
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| Publication date | 1993-01-01 |
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| Publisher | IOP Publishing |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23000867 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction |
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| Record identifier | 87b05cec-9cb9-4f7b-92fb-c24f560cb749 |
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| Record created | 2016-10-26 |
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| Record modified | 2020-04-24 |
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