Simultaneous multiple file EXAFS analysis: methodology and application to buried Ge–Si interfaces
Simultaneous multiple file EXAFS analysis: methodology and application to buried Ge–Si interfaces
DOI | Resolve DOI: https://doi.org/10.7567/JJAPS.32S2.134 |
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Author | Search for: Tyliszczak, T.; Search for: Aebi, P.; Search for: Hitchcock, A. P.; Search for: Jackman, T. E.1; Search for: Baribeau, J-M.1; Search for: Lockwood, D. J.1 |
Name affiliation |
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Format | Text, Article |
Proceedings title | XAFS VII: Proceedings of the 7th International Conference on X-ray Absorption Fine Structure, Kobe, Japan, August 23-29, 1992 |
Series title | Japanese Journal of Applied Physics; Volume 32 |
Conference | XAFS VII, the 7th International Conference on X-ray Absorption Fine Structure, August 23-29, 1992, Kobe, Japan |
ISSN | 0021-4922 1347-4065 |
Pages | 134–136 |
Subject | EXAFS; multi-file analysis; Si-Ge interface; atomic-layer superlattices; epitaxy |
Abstract | |
Publication date | 1993-01-01 |
Publisher | IOP Publishing |
Language | English |
Peer reviewed | Yes |
NPARC number | 23000867 |
Export citation | Export as RIS |
Report a correction | Report a correction |
Record identifier | 87b05cec-9cb9-4f7b-92fb-c24f560cb749 |
Record created | 2016-10-26 |
Record modified | 2020-04-24 |